B.8.1 IR Thermography for Quality Assessment of Microelectronic Devices

This work presents collaboration between electronics industry and University aimed to develop novel power cycling methodology combined with IR thermography for quality and reliability studies of microelectronic assemblies. For this purpose an array of programmable Thermo Electric Converters (TEC) was designed and constructed [1]. The array provides possibility of introduction of controlled anisothermal temperature field as a function of time. Such field is exploited for stimulation for IR thermography and lifetime acceleration experiments. Furthermore, an advanced method, which takes advantage of short stimulations by photon blast was used to perform Time Domain IR Thermography. Combination of such techniques provided information about the weakest points in the assembly, design and optimisation of the manufacturing processes.